The development of sharpened fringes in long path length interferometers (like the Twyman-Green, Mach-Zehnder, and series) by intensity and by multiple reflection is described. The cause of the extreme localization of some of the multiple-reflection fringe patterns is discussed.
WILLIAM PRIMAK, "Fringe Sharpening in Divided Beam Interferometers," J. Opt. Soc. Am. 48, 375-379 (1958)