Abstract

A triangular path shearing interferometer is described which can be used for the examination of large transparent objects. It has the advantage that it can be conveniently adapted to an existing schlieren system, affording the possibility of quantitative measurements. The additional optical elements required are only of comparatively small aperture and are therefore quite inexpensive.

© 1959 Optical Society of America

New Gauge Interferometer

P. Hariharan and D. Sen
J. Opt. Soc. Am. 49(3) 232-234 (1959)

Achromatic Fringes Formed in a Triangular Path Interferometer

P. Hariharan and R. G. Singh
J. Opt. Soc. Am. 49(7) 732-733 (1959)

Common-Path Interferometer for Testing Purposes

J. Dyson
J. Opt. Soc. Am. 47(5) 386-390 (1957)

Effect of Surface Roughness on the Phase Change at Reflection in Interferometers

B. S. Thornton
J. Opt. Soc. Am. 49(5) 476-479 (1959)

Interferometrically Controlled Ruling of Ten-Inch Diffraction Gratings*

George R. Harrison, Neville Sturgis, Sumner P. Davis, and Yahiko Yamada
J. Opt. Soc. Am. 49(3) 205-211 (1959)