Abstract
The index of refraction and extinction coefficient of a silicon surface highly doped with boron so as to appear as a semimetal are determined from the specular reflection. The classical theory of metals is employed to obtain a relationship between the optical and electrical properties. The results are substantiated by comparing the calculated and measured reflectance of silicon-monoxide layers of known optical properties deposited on the doped silicon surface.
© 1960 Optical Society of America
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