The reflectivity and transmissivity of Sb, Te, and Ti films have been measured in the range from 1600 to 450 A in order to compare the frequency at which the films change from a reflecting to a transmitting medium with the plasmà frequency predicted by Bohm and Pines and also with electron energy characteristic losses in metals observed by Marton <i>et al.</i> and by Powell.
OM P. RUSTGI, W. C. WALKER, and G. L. WEISSLER, "Optical Properties of Sb, Te, and Ti Films in the Vacuum Ultraviolet," J. Opt. Soc. Am. 51, 1357-1359 (1961)