Abstract

In deciding between alternative sampling systems for the absorption spectrometric analysis of a small quantity of material, a useful figure of merit is the quantity LT/V, where L is the length of the light path in the sample, V is the volume occupied by the sample, and T is the fractional beam energy passed by the sampling system when none of the sample material is present. It is shown that LT/V is inversely proportional to the amount of sample required for analysis, permitting the direct comparison of such diverse approaches as the KBr micropellet technique and low-concentration gas analysis.

© 1961 Optical Society of America

Integrating Sphere for Imperfectly Diffuse Samples*

D. K. Edwards, J. T. Gier, K. E. Nelson, and R. D. Roddick
J. Opt. Soc. Am. 51(11) 1279-1288 (1961)

Correlation between Random-Dot Samples and the Photographic Emulsion*

J. C. Marchant and P. L. P. Dillon
J. Opt. Soc. Am. 51(6) 641-644 (1961)

An Infrared Gas Microcell

George R. Bird
J. Opt. Soc. Am. 51(5) 579-580 (1961)

Calibration of Infrared Prism Spectrometers*

A. S. Filler and L. Indyk
J. Opt. Soc. Am. 51(5) 572-574 (1961)

Infrared Transmittance and Kerr Effect of Nitrobenzene

D. C. Cronemeyer and L. R. Spanberger
J. Opt. Soc. Am. 51(10) 1061-1066 (1961)