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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 52, Iss. 10 — Oct. 1, 1962
  • pp: 1149–1152

Methods of Altering the Characteristics of a Multilayer Stack

PHILIP W. BAUMEISTER  »View Author Affiliations


JOSA, Vol. 52, Issue 10, pp. 1149-1152 (1962)
http://dx.doi.org/10.1364/JOSA.52.001149


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Abstract

The reflectance R of a multilayer stack is changed as either the thickness t or refractive index n of any of the films in the stack is altered. An efficient method of computing the first partial derivatives ∂R/∂t and ∂R/∂n is presented. An example is cited in which these derivatives are employed in a relaxation process which is utilized to improve the design of a multilayer containing absorbing films, which is used as a reflection filter in the vacuum-ultraviolet spectral region.

Citation
PHILIP W. BAUMEISTER, "Methods of Altering the Characteristics of a Multilayer Stack," J. Opt. Soc. Am. 52, 1149-1152 (1962)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-52-10-1149


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References

  1. A. W.Crook,J. Opt. Soc. Am. 38, 954 (1948).
  2. P. Rouard, Ann. phys. 11, 342 (1950).
  3. H. Schröder, Z. angew. Phys. 3, 53 (1951).
  4. J. J. Leurgans, J. Opt. Soc. Am. 41, 714 (1951).
  5. F. Abelès, Ann. phys. 5, 103 (1950).
  6. P. W. Baumeister, J. Opt. Soc. Am. 48, 955 (1958).
  7. J. A. Dobrowolski, J. Opt. Soc. Am. 51, 1475(A) (1961).

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