Abstract

Opaque films of copper and indium have been evaporated on glass substrate, and the phase shift at reflection from the glass–metal interface has been determined both with white light and monochromatic fringes. Helium and krypton spectral lines with a koster interference comparator were used. Comparison is made between experimental results and theoretical calculations based on the electromagnetic theory for opaque copper films.

© 1963 Optical Society of America

On the Determination of the Relative Phase Change at Reflection Air–Metal and Its Variation with Thickness for Silver Layers

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Immersion Spectrophotometry of Interference Films: Refractive Indices of Fluoride Films on Uranium Dioxide and Anodic Oxide Films on Uranium Metal*

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Phase Changes on Reflection from Evaporated Chromium Films

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