Abstract

A method is described for calculating the error response of optical-reticle systems used to convert line-of-sight angle into an electrical signal. The calculation is carried out in the frequency domain and relates optical aberrations as expressed in terms of a spot diagram, and the reticle pattern which is characterized by a reticle phase function, to the amplitudes and phases of the significant harmonics in the output waveform. The procedure is easily programmed for a computer and permits the rapid evaluation of reticle and optical designs and design changes.

© 1964 Optical Society of America

Amplitude-modulated reticle constructed by a liquid crystal cell array

Y. Itakura, A. Sugimura, and S. Tsutsumi
Appl. Opt. 20(16) 2819-2826 (1981)

Statistical Analysis of Degradation in Scanned Image Systems

W. H. Beall
J. Opt. Soc. Am. 54(8) 992-997 (1964)

Measurement of Eye Movements by Contact Lens Techniques: Analysis of Measuring Systems and Some New Methodology For Three-Dimensional Recording*

Leonard Matin
J. Opt. Soc. Am. 54(8) 1008-1018 (1964)

Multidimensional Ratio Scaling Analysis of Perceived Color Relations

Carl E. Helm
J. Opt. Soc. Am. 54(2) 256-262 (1964)

Relative Precision of Range Information Obtainable with Fixed Ballistic and Wandermark Stereoscopic Reticles

George S. Harker and Lelon A. Weaver
J. Opt. Soc. Am. 46(3) 195-200 (1956)