Analytical Determination of Optical Constants Based on the Polarized Reflectance at a Dielectric-Conductor Interface
JOSA, Vol. 54, Issue 7, pp. 904-906 (1964)
http://dx.doi.org/10.1364/JOSA.54.000904
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Abstract
An analysis is made of the photometrically determined ratio of the reflectances for the components, polarized parallel and perpendicular to the plane of incidence. Given the experimentally determined minimum ratio R11/R1 value and the angle of incidence, φB, at that minimum for a specular surface, an analytic determination of the real and imaginary parts of the dielectric constant can be made. Curves are given showing the limits for which certain successive simplifying approximations can be made that are consistent with experimental accuracy. Data for a GaSb sample at λ= 5800 Å are given with the computed values of ε1, ε2, and n and k.
Citation
ROY F. POTTER, "Analytical Determination of Optical Constants Based on the Polarized Reflectance at a Dielectric-Conductor Interface," J. Opt. Soc. Am. 54, 904-906 (1964)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-54-7-904
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