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Determination of the Absolute Phase Change on Reflection at Chromium Films

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Abstract

The variation of the absolute phase change at the film–air interface, for film thickness up to 400 Å at λ5461 Å, is determined by the well-known method of Rouard. A modification of the Rouard method permits direct visual measurement of the ring system, eliminating the need for photography. A recent method of measuring the phase change, due to Weaver, Hill, and MacLeod, is also used. Comparison of the results obtained by the two methods shows agreement to within the experimental error thus verifying the validity of the latter method for the thickness range investigated.

© 1964 Optical Society of America

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