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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 56, Iss. 2 — Feb. 1, 1966
  • pp: 189–191

Transmittance of Tin Films in the Far Ultraviolet

K. CODLING, R. P. MADDEN, W. R. HUNTER, and D. W. ANGEL  »View Author Affiliations


JOSA, Vol. 56, Issue 2, pp. 189-191 (1966)
http://dx.doi.org/10.1364/JOSA.56.000189


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Abstract

The transmission spectra of tin films ranging in thickness from 680 to 1690 Å have been studied in detail in the spectral range 1000–80 Å, utilizing both photoelectric and photographic detection. The photoelectric results, using a multiline source, give measured values of transmittance, while the photographic results, using the pure continuum radiated by the NBS 180-MeV electron synchrotron, show the behavior of the transmittance curves between measured data points. These new measurements, giving continuous and extended information, allow an interpretation of the transmission characteristics of tin in terms of atomic and solid-state parameters. In particular, the photographic data locate the NIV, V x-ray edges with increased accuracy [NV=23.8(±0.1) eV; NIV=24.9(±0.1) eV]. Of practical importance, a film of thickness 680 Å has a transmittance of over 20% from 700 to 525 Å. Of theoretical significance is a broad absorption feature centered near 190 Å, due to the high oscillator strength for transition of the 4d electron to continuum states of ƒ symmetry.

Citation
K. CODLING, R. P. MADDEN, W. R. HUNTER, and D. W. ANGEL, "Transmittance of Tin Films in the Far Ultraviolet," J. Opt. Soc. Am. 56, 189-191 (1966)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-56-2-189


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References

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