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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 60, Iss. 1 — Jan. 1, 1970
  • pp: 49–53

Determination of Surface-Film Thickness from Shift of Optically Excited Surface Plasma Resonance

J. L. STANFORD  »View Author Affiliations


JOSA, Vol. 60, Issue 1, pp. 49-53 (1970)
http://dx.doi.org/10.1364/JOSA.60.000049


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Abstract

The strong coupling between photons and surface plasmons that occur on rough metal surfaces permits optical measurements of the shift of the surface plasma resonance frequency when the metal surface is covered with a thin film. Thin, discontinuous silver sulfide tarnish films on silver shift the resonance to lower frequencies and also damp the resonance, in agreement with surface plasmon dispersion theory. The wavelength of the dominant surface plasma wave is large compared to the size of the discontinuities, so the effect of the thin film should be the same as that of a continuous film whose thickness is the average thickness of the discontinuous film. On this basis, the thicknesses of several silver sulfide films are calculated from the measured frequency shift of the resonance peak and are found to be in excellent agreement with values determined from independent ellipsometric measurements.

Citation
J. L. STANFORD, "Determination of Surface-Film Thickness from Shift of Optically Excited Surface Plasma Resonance," J. Opt. Soc. Am. 60, 49-53 (1970)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-60-1-49


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References

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  15. The values used were obtained from the highest measured reflectance from smooth, freshly evaporated silver films. These values differ only slightly from those of Huebner et al. [R. H. Huebner, E. T. Arakawa, R. A. MacRae, and R. N. Hamm, J. Opt. Soc. Am. 54, 1434 (1964).]
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