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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 60, Iss. 3 — Mar. 1, 1970
  • pp: 416–417

Ellipsometric Study of Surface Contamination and Optical-Nonuniformity Effects on Electrolytic Electroreflectance

A. B. BUCKMAN  »View Author Affiliations


JOSA, Vol. 60, Issue 3, pp. 416-417 (1970)
http://dx.doi.org/10.1364/JOSA.60.000416


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Citation
A. B. BUCKMAN, "Ellipsometric Study of Surface Contamination and Optical-Nonuniformity Effects on Electrolytic Electroreflectance," J. Opt. Soc. Am. 60, 416-417 (1970)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-60-3-416


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References

  1. K. Shaklee, F. H. Pollak, and M. Cardona, Phys. Rev. Letters 15, 883 (1965).
  2. J. Feinleib, Phys. Rev. Letters 16, 1200 (1966).
  3. Y. Hamakawa, P. Handler, and F. A. Germano, Phys. Rev. 167, 709 (1968).
  4. B. O. Seraphin, Surface Sci. 13, 136 (1969).
  5. M. Steadman, Chem. Phys. Letters 2, 457 (1968).
  6. D. E. Aspnes and A. Frova, Solid State Commun. 7, 155 (1969).
  7. F. Evangelisti and A. Frova, Solid State Commun. 6, 621 (1968).
  8. A. B. Buckman and N. M. Bashara, Phys. Rev. 174, 719 (1968).
  9. E. Schmidt and W. H. Knausenberger, J. Opt. Soc. Am. 59, 857 (1969).
  10. A. B. Buckman and N. M. Bashara, J. Opt. Soc. Am. 58, 700 (1968).
  11. F. L. McCrackin and J. P. Colson, Ellipsometry in the Measurement of Surfaces and Thin Films. Natl. Bur. Std. (U. S.) Misc. Publ. 256 (U. S. Govt. Printing Office, Washington, D. C., 1964), p. 61.

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