OSA's Digital Library

Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 60, Iss. 4 — Apr. 1, 1970
  • pp: 495–498

Ultraviolet Optical Constants of Thin Films Determined by Reflectance Measurements

G. BALDINI and L. RIGALDI  »View Author Affiliations


JOSA, Vol. 60, Issue 4, pp. 495-498 (1970)
http://dx.doi.org/10.1364/JOSA.60.000495


View Full Text Article

Acrobat PDF (371 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

The thickness and the complex refractive index of a moderately thin absorbing film on a transparent substrate of known optical properties can be determined by measuring the values of reflectance of the sample from opposite sides, and the transmittance. The technique and its use in measuring properties of films of RbI in the uv are described. Errors are reduced by averaging the values of thickness obtained at several wavelengths and by iterating the computations.

Citation
G. BALDINI and L. RIGALDI, "Ultraviolet Optical Constants of Thin Films Determined by Reflectance Measurements," J. Opt. Soc. Am. 60, 495-498 (1970)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-60-4-495

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited