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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 61, Iss. 6 — Jun. 1, 1971
  • pp: 740–745

Optical Properties of Cs for Photons of Energy 3.6–9.6 eV

U. S. WHANG, E. T. ARAKAWA, and T. A. CALLCOTT  »View Author Affiliations

JOSA, Vol. 61, Issue 6, pp. 740-745 (1971)

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The optical and dielectric constants of Cs have been obtained above the plasma frequency. The measurements were made on Cs films evaporated on a plane surface of quartz and CaF2 semicylindrical substrates, at 10-6 torr. The refractive index n is determined from the critical angle for total internal reflection at the Cs-substrate interface. The absorption coefficient k is determined from the slope of the curve at the critical angle. The real part of the complex dielectric constant ∊l differs from the value predicted by the nearly free-electron model. The effect is attributed to the existence of transitions from inner shells at higher photon energies and to interband transitions and plasmon-assisted transitions at lower energies. The derived parameters in this energy region are 4πn0α=0.37±0.01, meff=1.05±0.05 m, and ħωp=2.87±0.07 eV.

U. S. WHANG, E. T. ARAKAWA, and T. A. CALLCOTT, "Optical Properties of Cs for Photons of Energy 3.6–9.6 eV," J. Opt. Soc. Am. 61, 740-745 (1971)

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