An aggregated silver film shows absorption bands in the visible and the near-ultraviolet spectral regions caused by the plasma resonances of conduction electrons in the island particles composing the film, for electric fields parallel and perpendicular to the substrate. We derive the relation between the peak wavelengths of absorption bands in terms of the model based on a two-dimensional distribution of island particles and propose the method for the determination of the inter-island dielectric constant ∊a. The method is applied to aggregated silver films and the thickness dependence of ∊a is found.
© 1972 Optical Society of America
SADAFUMI YOSHIDA, TOMUO YAMAGUCHI, and AKIRA KINBARA, "Determination of the Inter-Island Dielectric Constant in Aggregated Silver Films, by Measurement of Optical Plasma Resonance Absorption," J. Opt. Soc. Am. 62, 1415-1419 (1972)