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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 62, Iss. 6 — Jun. 1, 1972
  • pp: 762–766

Echelle Calibration and Wavelength Calculation

FRANK L. MOORE, JR. and BENJAMIN FURST  »View Author Affiliations


JOSA, Vol. 62, Issue 6, pp. 762-766 (1972)
http://dx.doi.org/10.1364/JOSA.62.000762


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Abstract

Two methods for calibration and wavelength calculation for echelle spectrograms are discussed. The rough method employing ruler measurements on photographic enlargements has an accuracy of about 1 in 105. The accurate method using comparator measurements of Th standard lines and a computer routine has given an accuracy of 2 in 107 and promises greater precision for spectrograms obtained with modern echelle gratings.

Citation
FRANK L. MOORE, JR. and BENJAMIN FURST, "Echelle Calibration and Wavelength Calculation," J. Opt. Soc. Am. 62, 762-766 (1972)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-62-6-762


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References

  1. N. A. Finkelstein, J. Opt. Soc. Am. 43, 90 (1953).
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  4. We have discarded the field lens in front of the Littrow slit because it further complicates the mλ space on the plate and because good focus can be obtained only in its absence.
  5. C. F. Freer, Jr., Ph.D. thesis, Clarkson College, 1970; Dissertation Abstr. Intern. 31 2931B (1970) (Univ. Microfilm, Ann Arbor, Mich., Order No. 70–22 582).
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  13. B. Furst, Ph.D. thesis, Clarkson College, 1971; Dissertation Abstr. Intern. 32, 4137B (1972) (Order No. 72-1730).

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