Abstract

Ellipsometric measurements of the refractive index and absorption coefficient of vacuum-evaporated perylene films are reported for the wavelength range 0.35 μm ≤ λ ≤ 0.7 μm. An independent determination of refractive index at one wavelength by a critical-angle measurement allows calculation of both optical constants as well as the film thickness from the ellipsometer data. The principal features of the wavelength dependence of the film absorption are a broad maximum around 0.5 μm, a weak peak from 0.41 − 0.45 μm, and a strong edge at 0.375 μm. Each of these features corresponds to a peak in the crystal absorption spectrum measured by Hochstrasser.

© 1973 Optical Society of America

Optical constants and reflectance and transmittance of evaporated rhodium films in the visible*

J. K. Coulter, G. Hass, and J. B. Ramsey
J. Opt. Soc. Am. 63(9) 1149-1153 (1973)

Optical constants of Inconel alloy films

W. V. Goodell, J. K. Coulter, and P. B. Johnson
J. Opt. Soc. Am. 63(2) 185-188 (1973)

Effects of vacuum deposition conditions on ellipsometric parameters, optical constants, and reflectance of ultrapure aluminum films

J. H. Halford, F. K. Chin, and J. E. Norman
J. Opt. Soc. Am. 63(7) 786-792 (1973)

Optical characterization of thin films: Theory

Wilford N. Hansen
J. Opt. Soc. Am. 63(7) 793-802 (1973)

Reflectance and optical constants of evaporated osmium in the vacuum ultraviolet from 300 to 2000 Å*

J. T. Cox, G. Hass, J. B. Ramsey, and W. R. Hunter
J. Opt. Soc. Am. 63(4) 435-438 (1973)