Far-field diffraction by a semi-infinite plane: perpendicular polarization
JOSA, Vol. 63, Issue 4, pp. 419-421 (1973)
http://dx.doi.org/10.1364/JOSA.63.000419
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Abstract
Diffraction of an incident plane wave caused by a perfectly conducting, infinitesimally thick half-plane is considered in the far-field region for the case when the electric vector is polarized perpendicular to the axis of the edge. Measurements in all quadrants, with microwaves and a 0.059λ-thick screen, verify the theoretical solution of the problem due to Sommerfeld. A pronounced thickness effect is observed in the irradiance distribution when 0.18λ- and 0.37λ-thick planes are examined. The dependence with respect to polarization of the thickness effect in the diffraction pattern is discussed.Index Headings: Diffraction; Scattering; Polarization; Microwaves.
Citation
F. S. Einstein, R. A. Juliano, Jr., and C. Pine, "Far-field diffraction by a semi-infinite plane: perpendicular polarization," J. Opt. Soc. Am. 63, 419-421 (1973)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-63-4-419
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