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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 64, Iss. 10 — Oct. 1, 1974
  • pp: 1337–1342

Optical diffusiometer for submicrometer-distance energy-diffusion determination

H. P. Weber and P. F. Liao  »View Author Affiliations


JOSA, Vol. 64, Issue 10, pp. 1337-1342 (1974)
http://dx.doi.org/10.1364/JOSA.64.001337


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Abstract

We describe and demonstrate a novel method to measure directly excitation-energy migration distances in fluorescing materials. In any desired direction, migration distances corresponding to 1/10 to 3 times the fluorescence wavelength can be determined with an accuracy of ~ 10%. Fluorescing materials in the form of typically 10-µm-thick samples are coated with a mirror on one surface. A coherent excitation beam is used to create a standing-wave pattern in the sample. The fluorescence radiation is shown to possess an interference peak in one particular direction. In the case of energy diffusion, this peak becomes indistinct. From the amplitude of the peak, the energy-diffusion distance is directly obtained. The existence of the peak, its position and amplitude are experimentally verified by use of a fluorescing film of rhodamine 6G doped polyurethane.

Citation
H. P. Weber and P. F. Liao, "Optical diffusiometer for submicrometer-distance energy-diffusion determination," J. Opt. Soc. Am. 64, 1337-1342 (1974)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-64-10-1337


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References

  1. Th. Förster, Ann. Physik 2, 55 (1948); D. L. Dexter, J. Chem. Phys. 21, 836 (1953). For a recent review, see W. J. G. Grant, Phys. Rev. B 4, 648 (1971) and the references cited therein.
  2. See, for example, L. G. Van Uitert and S. Ida, J. Chem. Phys. 37, 986 (1962); G. E. Peterson and P. M. Bridenbaugh, J. Opt. Soc. Am. 54, 644 (1964); J. P. Van der Ziel, L. Kopf, and L. G. Van Uitert, Phys. Rev. B 6, 615 (1972).
  3. See, for example, L. G. Van Uitert, in Luminescence of Inorganic Solids, edited by P. Goldberg (Academic, New York, 1966), p. 465; M. J. Weber, J. Appl. Phys. 44, 4058 (1973).
  4. C. L. Tang, H. Statz, and G. A. de Mars, J. Appl. Phys. 35, 2289 (1963).
  5. H. G. Danielmeyer, J. Appl. Phys. 42, 3125 (1971).
  6. M. Yokota and O. Tamimoto, J. Phys. Soc. Jpn. 22, 779 (1967); M. Inokuti and F. Hirayama, J. Chem. Phys. 43, 1978 (1965); M. J. Weber, Phys. Rev. B 4, 2932 (1971).
  7. M. Blätte, H. G. Danielmeyer, and R. Ulrich, Appl. Phys. 1, 275 (1973); H. P. Weber, B. C. Tofield, and T. C. Damen, in Optical Society Topical Meeting on Integrated Optics, Paper MB8, New Orleans, 21–24 January 1974.
  8. For purpose for this paper, we shall refer to the mirror as a reflecting metal; however, a dielectric mirror or total-internal reflection may serve the same purpose.
  9. See, for example, W. Macke, Thermodyamik und Statistik, (Akademische Verlagsgesellschaft, Leipzig, 1962), p. 22.
  10. The presence of a reflecting surface also affects the lifetime of fluorescing centers that are closer to the surface than ~λƒ. See, e.g., K. H. Drexhage, J. Lumin. 1,2, 693 (1970). For samples of thickness b»λƒ this effect influences our results insignificantly.
  11. R. Ulrich and H. P. Weber, Appl. Opt. 11, 428 (1972).
  12. M. Born and E. Wolf, Principles of Optics, 3rd ed. (Pergamon, New York, 1965), pp. 628–630.
  13. W. J. Tomlinson and H. P. Weber, J. Opt. Soc. Am. 63, 685 (1973).

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