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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 64, Iss. 11 — Nov. 1, 1974
  • pp: 1450–1455

Kramers-Kronig dispersion analysis of LiF reflectance data obtained at ambient and low temperatures

A. Kachare, M. P. Soriaga, and G. Andermann  »View Author Affiliations


JOSA, Vol. 64, Issue 11, pp. 1450-1455 (1974)
http://dx.doi.org/10.1364/JOSA.64.001450


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Abstract

Room-, liquid-nitrogen-, and liquid-helium-temperature mid-infrared reflectance spectra of lithium fluoride have been measured at near-normal incidence with special emphasis placed on obtaining precise and accurate data in the difficult Rminimum region. The reliability of the measured Rmin curves has been evaluated by a previously suggested mathematical technique. Far-infrared data available from the literature were utilized to construct the low-frequency reflection wings. The newly obtained reflectance data have been processed by an improved Kramers-Kronig dispersion-analysis technique, leading to optical indices significantly more reliable than those reported to date.

Citation
A. Kachare, M. P. Soriaga, and G. Andermann, "Kramers-Kronig dispersion analysis of LiF reflectance data obtained at ambient and low temperatures," J. Opt. Soc. Am. 64, 1450-1455 (1974)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-64-11-1450


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