Abstract
The optical constants of the manganese and bismuth constituents, and of the silicon monoxide protective coating of MnBi films have been measured. These values were used to compute the reflectance as a function of film thickness, which were compared with reflectance measurements at 6328 Å made during film deposition.
© 1974 Optical Society of America
Full Article | PDF ArticleMore Like This
J. T. Cox, G. Hass, J. B. Ramsey, and W. R. Hunter
J. Opt. Soc. Am. 64(4) 423-428 (1974)
W. R. Hunter and G. Hass
J. Opt. Soc. Am. 64(4) 429-433 (1974)
R. W. Fane and W. E. J. Neal
J. Opt. Soc. Am. 60(6) 790-793 (1970)