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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 65, Iss. 1 — Jan. 1, 1975
  • pp: 25–28

Analysis of a novel ellipsometric technique with special advantages for infrared spectroscopy

R. W. Stobie, B. Rao, and M. J. Dignam  »View Author Affiliations


JOSA, Vol. 65, Issue 1, pp. 25-28 (1975)
http://dx.doi.org/10.1364/JOSA.65.000025


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Abstract

Sensitivity calculations are given for a novel ellipsometric technique that involves a rotating polarizer or analyzer and the measurement of signal phase angles. It is superior to optical null techniques under signal-limited conditions, and avoids the difficulties that attend precise signal-amplitude measurements. Noise coefficients as functions of optical-component settings and surface properties are presented for the technique and compared with those for the conventional ellipsometer.

Citation
R. W. Stobie, B. Rao, and M. J. Dignam, "Analysis of a novel ellipsometric technique with special advantages for infrared spectroscopy," J. Opt. Soc. Am. 65, 25-28 (1975)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-65-1-25


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References

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