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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 66, Iss. 2 — Feb. 1, 1976
  • pp: 147–150

Method for synthetic-aperture electron microscopy

Takehiko Hidaka  »View Author Affiliations


JOSA, Vol. 66, Issue 2, pp. 147-150 (1976)
http://dx.doi.org/10.1364/JOSA.66.000147


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Citation
Takehiko Hidaka, "Method for synthetic-aperture electron microscopy," J. Opt. Soc. Am. 66, 147-150 (1976)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-66-2-147


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References

  1. C. H. Hall, Introduction to Electron Microscopy (McGraw-Hill, New York, 1963).
  2. D. Gabor, Nature 161, 777 (1948).
  3. M. E. Haine and T. Mulvey, J. Opt. Soc. Am. 42, 163 (1952).
  4. T. Hibi, J. Electron Microsc. 4, 10 (1956).
  5. A. Tonomura A. Fukuhara, H. Watanabe, and T. Komoda, Jpn. J. Appl. Phys. 7, 296 (1968).
  6. H. Tomita, T. Matsuda, and T. Komoda, Jpn. J. Appl. Phys. 11, 143 (1972).
  7. G. W. Stroke and G. Zech, Phys. Lett. A 25, 89 (1967).
  8. G. W. Stroke and M. Halioua, Phys. Lett. A 33, 3 (1970).
  9. G. W. Stroke and M. Halioua, Optik (Stuttgart) 35, 50 (1972).
  10. L. J. Cutrona and E. N. Leith, Proc. IEEE 54, 1026 (1966).
  11. T. Hidaka, J. Appl. Phys. 46, 786 (1975).

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