Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Modulated generalized ellipsometry

Not Accessible

Your library or personal account may give you access

Abstract

We extend ellipsometry to the direct measurement of small perturbations of the Jones matrix of any linear nondepolarizing optical sample (system) subjected to a modulating stimulus such as temperature, stress, or electric or magnetic field. The methodology of this technique, to be called Modulated Generalized Ellipsometry (MGE), is presented. First an ellipsometer with arbitrary polarizing and analyzing optics is assumed, and subsequently the discussion is specialized to a conventional ellipsometer having either the polarizer-sample-analyzer (PSA) or the polarizer-compensator-sample-analyzer (PCSA) arrangement. MGE provides the tool for the systematic study of thermo-optical, piezo-optical, electro-optical, magneto-optical, and other allied effects for both isotropic and anisotropic materials that may be examined in either transmission or reflection. MGE is also applicable to (1) modulation spectroscopy of anisotropic media, (2) the study of electrochemical reactions on optically anisotropic electrodes, and (3) the extension of AIDER (angle-of-incidence-derivative ellipsometry and reflectometry) to the determination of the optical properties of anisotropic film-substrate systems.

© 1976 Optical Society of America

Full Article  |  PDF Article
More Like This
Frequency-mixing detection (FMD) of polarization-modulated light

R. M. A. Azzam
J. Opt. Soc. Am. 66(7) 735-739 (1976)

Application of generalized ellipsometry to anisotropic crystals*

R. M. A. Azzam and N. M. Bashara
J. Opt. Soc. Am. 64(2) 128-133 (1974)

Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO2)

G. E. Jellison, F. A. Modine, and L. A. Boatner
Opt. Lett. 22(23) 1808-1810 (1997)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (2)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Tables (2)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (37)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved