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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 68, Iss. 4 — Apr. 1, 1978
  • pp: 514–518

Generalized ellipsometry based on azimuth measurements alone

R. M. A. Azzam  »View Author Affiliations


JOSA, Vol. 68, Issue 4, pp. 514-518 (1978)
http://dx.doi.org/10.1364/JOSA.68.000514


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Abstract

We investigate the azimuth response function, θo = f(θi), of a linear nondepolarizing optical system S, whereθi and θo, are the azimuths (orientations) of the generally elliptic vibrations of totally polarized light at the input and output of S. We find that the azimuth response function depends on five of the six parameters that specify the normalized circular Jones matrix of the optical system. Thus the entire polarization response of an optical system can be nearly completely reconstructed from its azimuth response alone. Five input-output azimuth measurements (θik, θok), k = 1, 2, ..., 5 are sufficient to fix the ARF. The procedure for such determination is considerably facilitated if the average of θo, when θi sweeps a full rang of π, is measured. The general design and automation of an instrument for performing azimuth measurements are discussed and the use of such measurements to determine the optical parameters of elliptic retarders is given as an application.

© 1978 Optical Society of America

Citation
R. M. A. Azzam, "Generalized ellipsometry based on azimuth measurements alone," J. Opt. Soc. Am. 68, 514-518 (1978)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-68-4-514


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References

  1. J. Monin and G.-A. Boutry, "Conception, réalisation et fonctionnement d'un nouvel ellipsomètre," Nouv. Rev. Opt. 4, 159–169 (1973); and Refs. (19) and (20) listed therein.
  2. S. C. Som and C. Chowdhury, "New ellipsometric method for the determination of the optical constants of thin films and surfaces," J. Opt. Soc. Am. 62, 10–15 (1972).
  3. Such an extension is a special case of generalized ellipsometry (see, e.g., R. M. A. Azzam and N. M. Bashara, "Applications of generalized ellipsometry to anisotropic crystals," J. Opt. Soc. Am. 64, 128–133 (1974)).
  4. For definiteness, we assume that θi and θo are measured from the plane of the incident and outgoing beams.
  5. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977), Sec. 2.2.5.
  6. Reference 5, Sec. 1.7.2.
  7. Reference 5, Sec. 2.3.
  8. The ensuing analysis can easily be adapted to the general case of any (but fixed) input ellipticity (εi ≠ 0).
  9. R. M. A. Azzam, "Hybrid null-photometric ellipsometer using sinusoidal optical rotation," Optik 48, 279–288 (1977).
  10. A. V. S. S. S. R. Sarma, "New experimental methods for determining the optical parameters of elliptic retarders," J. Phys. D: Appl. Phys. 10, 2019–2030 (1977).
  11. F. El-Hosseiny, "Methods for determining the optical parameters of elliptic retarders," J. Opt. Soc. Am. 65, 1279–1282 (1975).
  12. Reference 5, p. 488.
  13. R. C. Jones, "A new calculus for the treatment of optical systems. VII, Properties of the N-matrices," J. Opt. Soc. Am. 38, 671–685 (1948).
  14. S. I. Idnurm, "Method of determing the parameters of inhomogeneous anisotropic media using a photoelectric polariscope," Opt. Spectrosc. 42, 210–212 (1977).

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