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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 68, Iss. 4 — Apr. 1, 1978
  • pp: 523–526

A new method to measure stress-induced birefringence in an opaque material: Stress-induced Raman scattering

Meera Chandrasekhar, M. H. Grimsditch, and M. Cardona  »View Author Affiliations


JOSA, Vol. 68, Issue 4, pp. 523-526 (1978)
http://dx.doi.org/10.1364/JOSA.68.000523


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Abstract

We describe a new technique to measure the piezo-optical constants of a material in a frequency region where it is opaque. The technique employs Raman scattering. Using this new method we measure the magnitudes of the piezo-optical constants π<sub>11</sub> - π<sub>12</sub>and π<sub>44</sub> in silicon at 1.92 eV. Previous measurements were limited to below and near the fundamental edge at 1.1 eV. Using this technique it should be possible to extend the measurements of the piezo-optical constants in a large number of opaque materials.

© 1978 Optical Society of America

Citation
Meera Chandrasekhar, M. H. Grimsditch, and M. Cardona, "A new method to measure stress-induced birefringence in an opaque material: Stress-induced Raman scattering," J. Opt. Soc. Am. 68, 523-526 (1978)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-68-4-523


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References

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  12. Obained from Monsanto Chemical Company.
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