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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 68, Iss. 7 — Jul. 1, 1978
  • pp: 978–983

Characterization of a very thin uniaxial film on a nonabsorbing substrate by multiple wavelength ellipsometry: Palmitic acid on water

G. T. Ayoub and N. M. Bashara  »View Author Affiliations


JOSA, Vol. 68, Issue 7, pp. 978-983 (1978)
http://dx.doi.org/10.1364/JOSA.68.000978


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Abstract

At compact monolayer coverage the anisotropic rodlike molecules of palmitic acid, aligned parallel to each other and perpendicular to the monolayer film, are insensitive to wavelength dispersion relative to a water substrate. The relative absence of dispersion of the monolayer film makes it possible to obtain sufficient data to characterize the three unknowns of palmitic acid: the real refractive indices parallel and perpendicular to the plane of the film and the film thickness. Other nonabsorbing thin-film-substrate systems should lend themselves to similar analysis (where the dispersion of the film is relatively less than that of the substrate); particularly since automated, wavelength-tracking ellipsometers are coming into greater use.

© 1978 Optical Society of America

Citation
G. T. Ayoub and N. M. Bashara, "Characterization of a very thin uniaxial film on a nonabsorbing substrate by multiple wavelength ellipsometry: Palmitic acid on water," J. Opt. Soc. Am. 68, 978-983 (1978)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-68-7-978

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