OSA's Digital Library

Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 70, Iss. 12 — Dec. 1, 1980
  • pp: 1513–1518

Extreme ultraviolet optical properties of two SiO<sub>2</sub> based low-expansion materials

J. Rife and J. Osantowski  »View Author Affiliations

JOSA, Vol. 70, Issue 12, pp. 1513-1518 (1980)

View Full Text Article

Acrobat PDF (660 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



Reflectances of two low-expansion materials, a recrystallized glass ceramic and a high silica glass, have been measured at five angles of incidence from 15° to 85° in the wavelength region from 80 to 310 Å and in some cases up to 1050 Å Optical constants are derived and silicon core-level transitions analyzed.

J. Rife and J. Osantowski, "Extreme ultraviolet optical properties of two SiO<sub>2</sub> based low-expansion materials," J. Opt. Soc. Am. 70, 1513-1518 (1980)

Sort:  Author  |  Year  |  Journal  |  Reset


  1. The two low-expansion glasses, procured for this study by NASA, are Cer-Vit® C101 (glass A): Owens-Illinois Glass Co., Toledo, Ohio 43604, and Code 7971-ULE®-Glass (glass B): Corning Glass Works, Corning, New York 14830. The investigation of these materials does not constitute a recommendation or an endorsement by the National Bureau of Standards.
  2. O. A. Ershov, I. A. Brytov, and A. P. Lukirskii, "Reflection of x-rays from certain substances in the region from 7 to 44 Å, Opt. Spectrosc. 22, 66–69 (1967); E. P. Savinov, I. L. Lyakhovskaya, O. A. Ershov, and E. A. Kovalyeva, "Graphical solution of the Fresnel equations and the calculation of the optical constants in the ultrasoft x-ray region of the spectrum," Opt. Spectrosc. 27, 179–181 (1969).
  3. J. Osantowski "Reflectance and optical constants for Cer-Vit from 250 to 1050 Å, "J. Opt. Soc. Am. 64, 834–838 (1974).
  4. J. Rife and J. Osantowski, "Mirror reflectivities from 50 to 150 eV," J. Nucl. Inst. Meth. 172, 297–301 (1980).
  5. D. L. Ederer and S. Ebner, "A User’s Guide to SURF," Natl. Bur. Stand. Internal Report, 1976 (unpublished).
  6. Workshop on X-Ray Instrumentation for Synchrotron Radiation Research, edited by H. Winick and G. Brown, SSRL Report No. 78/04 (Stanford Synchrotron Laboratory, Stanford, 1978).
  7. A. Franks and M. Stedman, "X-ray gratings—substrate and performance studies," J. Nucl. Instrum. Meth. 172, 249–257 (1980).
  8. M. Born and E. Wolf, Principles of Optics Oxford, 1964).
  9. C. A. Neugebauer, "Structural disorder phenomena in thin metal films," Phys. Thin Films 2, 1–59 (1964).
  10. V. Rehn, V. O. Jones, J. M. Elson, and J. M. Bennett, "The role of surface topography in predicting scattering at grazing incidence from optical surfaces," J. Nucl. Instrum. Meth. 172, 307–314 (1980).
  11. H. E. Bennett and J. O. Porteus, "Relation between surface roughness and specular reflectance at normal incidence," J. Opt. Soc. Am. 51, 123–129 (1961).
  12. D. L. Griscom, "Electronic structure of SiO2," J. Non-Cryst. Solids 24, 155–234 (1977).
  13. The Physics of SiO2 and its Interfaces, edited by S. T. Pantelides (Pergamon New York, 1978).
  14. J. W. Berthold, III and S. F. Jacobs, "Ultraprecise thermal expansion measurements of seven low expansion materials," Appl. Opt. 15, 2344–2347 (1976).
  15. Chi-Tang Li and Donald R. Peacor, "The crystal structure of Li-AlSi2O6–II ("β-spodumene")," Zeit Kris. 126, 46–65 (1968).
  16. H. T. Smyth, "The role of transverse oxygen vibrations in thermal expansion behavior of glasses and crystals," in Thermal Expansion edited by M. B. Graham and H. E. Hagy (AIP, New York, 1972) pp. 244–256.
  17. H. R. Phillip, "Optical transitions in crystalline and fused quartz," Solid State Commun. 4, 73–75 (1966).
  18. Yasuo Iguchi, "Soft x-ray spectra of solids containing silicon in tetrahedral and octahedral coordination with oxygen," Sci. Light 26, 161–181 (1977).
  19. C. Sénémand and M. T. Costa Limo, "K x-ray spectra of amorphous and crystalline SiO2," in Ref. 13, pp. 75–79.
  20. T. H. D. Stefano and D. E. Eastman, "Photoemission measurements of the valence levels of amorphous SiO2," Phys. Rev. Lett. 27, 1560–1562 (1972).
  21. W. Gudat and C. Kunz, "Yields spectroscopy and EDC spectra of LiF," in Vacuum Ultraviolet Radiation Physics—IV, edited by E. E. Koch, R. Haensel, and C. Kunz (Pergamon, Germany, 1974) pp. 392–395.
  22. L. G. Parratt, "Surface studies of solids by total reflection of x rays," Phys. Rev. 95, 359–369 (1954).
  23. O. A. Ershov and A. P. Lukirskii, "Investigation of the energy structure of Si and SiO2 by ultrasoft x-ray emission and absorption spectroscopy," Sov. Phys. Sol State 8, 1699–1703 (1967).
  24. F. Brown, R. Z. Bachrach, and M. Skibowski, "L2,3 threshold spectra of doped silicon and silcon compounds," Phys. Rev. B 15, 4781–4788 (77).
  25. F. J. Grunthaner, P. J. Grunthaner, R. P. Vasquez, B. F. Lewis, J. Maserjian, and A. Madhukar, "High-resolution x-ray photoelectron spectroscopy as a probe of local atomic structure: application to amorphous SiO2 and the Si-SiO2 interface," Phys. Rev. Lett. 43, 1683–1686 (1979).
  26. C. Kunz, "Soft x-ray excitation of core electrons in metals and alloys," in Optical Properties of Solids—New Developments, edited by B. O. Seraphin (North-Holland, Amsterdam, 1976) pp. 473–553.
  27. J. A. Tossell, "The electronic structures of silicon, aluminum, and magnesium in tetrahedral coordination with oxygen from ScF-x αMO calculations," J. Am. Chem. Soc. 97, 4840–4844 (1975).
  28. K. Codling and R. P. Madden, "Structure in the LII,III absorption of aluminum and its oxides," Phys. Rev. 167, 587–591 (1968).
  29. H. J. Hageman, W. Gudat, and C. Kunz, "Optical constants from the far infrared to the x-ray region: Mg, Al, Cu, Ag, Au, Bi, C, and A12O3." Deutsches Elektronen-Synchrotron (DESY) report SR-74/7, Hamburg, Germany (unpublished).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited