Abstract
The principle is presented of a fast, high-sensitivity ellipsometer that can measure azimuth and ellipticity simultaneously with good time resolution (better than 1 kHz) and high accuracy, even if relatively low-quality polarizers are used. Although the method can also be used for visible wavelengths, it is particularly useful for polarimetric measurements in the far infrared on plasmas with a magnetic field.
© 1982 Optical Society of America
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