OSA's Digital Library

Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 72, Iss. 8 — Aug. 1, 1982
  • pp: 1084–1089

Analysis of gratings by the beam-propagation method

D. Yevick and L. Thylén  »View Author Affiliations


JOSA, Vol. 72, Issue 8, pp. 1084-1089 (1982)
http://dx.doi.org/10.1364/JOSA.72.001084


View Full Text Article

Acrobat PDF (655 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We demonstrate that the beam-propagation method can be employed to calculate the electric-field amplitude inside and outside a grating structure excited by an arbitrary incident field. We establish the accuracy of the method by comparing our results for constant-period gratings with results obtained from other theoretical methods. Subsequently, we analyze thick-focusing gratings with the beam-propagation method.

© 1982 Optical Society of America

Citation
D. Yevick and L. Thylén, "Analysis of gratings by the beam-propagation method," J. Opt. Soc. Am. 72, 1084-1089 (1982)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-72-8-1084

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited