We demonstrate that the beam-propagation method can be employed to calculate the electric-field amplitude inside and outside a grating structure excited by an arbitrary incident field. We establish the accuracy of the method by comparing our results for constant-period gratings with results obtained from other theoretical methods. Subsequently, we analyze thick-focusing gratings with the beam-propagation method.
© 1982 Optical Society of America
D. Yevick and L. Thylén, "Analysis of gratings by the beam-propagation method," J. Opt. Soc. Am. 72, 1084-1089 (1982)