Beam reflection from lossy dielectric layers
JOSA, Vol. 73, Issue 12, pp. 1714-1718 (1983)
http://dx.doi.org/10.1364/JOSA.73.001714
Acrobat PDF (468 KB)
Abstract
A beam incident upon a slightly lossy layered dielectric structure at special (phase-matched) angles displays abnormal absorption and lateral beam shift on reflection. The amplitude of the reflected beam can be calculated either by a conventional transform technique or by a quasi-particle method. Different wave-number (k) expansions of the reflection coefficient may be employed for calculation of reflected beam properties. The convergence of these expansions is limited by the presence of poles and zeros and by the rapidity of dispersion in k of the reflection coefficient. The series expansions used in the quasi-particle method are not limited by the zeros and converge better for far fields than for fields on the reflecting surface; moreover, they permit faster numerical calculation of beam properties.
© 1983 Optical Society of America
Citation
Soo-Young Lee and Nathan Marcuvitz, "Beam reflection from lossy dielectric layers," J. Opt. Soc. Am. 73, 1714-1718 (1983)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-73-12-1714
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription





OSA is a member of 