Abstract

A transparent or absorbing substrate can be coated with a transparent thin film to produce a linear reflectance-versus-angle-of-incidence response over a certain range of angles. Linearization at and near normal incidence is a special case that leads to a maximally flat response for p-polarized, s-polarized, or unpolarized light. For midrange and high-range linearization with moderate and high slopes, respectively, the best results are obtained when the incident light is s polarized. Application to a Si substrate that is coated with a SiO₂ film leads to novel passive and active reflection rotation sensors. Experimental results and an error analysis of this rotation sensor are presented.

© 1995 Optical Society of America

Limaçon of Pascal locus of the complex refractive indices of interfaces with maximally flat reflectance-versus-angle curves for incident unpolarized light

R. M. A. Azzam
J. Opt. Soc. Am. A 9(6) 957-963 (1992)

Interfaces with fractional optical constants and linear reflectance versus angle of incidence for incident unpolarized or circularly polarized light

R. M. A. Azzam
Appl. Opt. 56(16) 4882-4885 (2017)

Achieving a given reflectance for unpolarized light by controlling the incidence angle and the thickness of a transparent thin film on an absorbing substrate: application to energy equipartition in the four-detector photopolarimeter

R. M. A. Azzam and Kurt A. Giardina
Appl. Opt. 31(7) 935-942 (1992)

Quarter-wave layers with 50% reflectance for obliquely incident unpolarized light

R. M. A. Azzam and F. F. Sudradjat
J. Opt. Soc. Am. A 24(3) 850-855 (2007)

Extinction of the p and s polarizations of a wave on reflection at the same angle from a transparent film on an absorbing substrate: applications to parallel-mirror crossed polarizers and a novel integrated polarimeter

R. M. A. Azzam
J. Opt. Soc. Am. A 2(2) 189-197 (1985)