Abstract

Standard formulations of rigorous Fourier-expansion analysis methods of lamellar gratings reduce, irrespective of the state of polarization, to the TE result of the lowest-order theory of form birefringence when only the zeroth-order terms are retained in the field and permittivity expansions. A reformulation is presented that reduces to the correct form-birefringence result also in the TM case. Expressions are given for the effective relative permittivities ∊_eff of a subwavelength-period grating with an arbitrary relative-permittivity profile ∊_r(x): the lowest-order approximation for ∊_eff is given by the zeroth-order Fourier coefficient of ∊_r(x) in TE polarization and of 1/∊_r(x) in TM polarization.

© 1996 Optical Society of America

Form-birefringence limits of Fourier-expansion methods in grating theory: arbitrary angle of incidence

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Highly improved convergence of the coupled-wave method for TM polarization

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Convergence of the coupled-wave method for metallic lamellar diffraction gratings

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Form-birefringence limits of Fourier-expansion methods in grating theory: errata

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J. Opt. Soc. Am. A 14(9) 2317-2322 (1997)