Method of source terms for dipole emission modification in modes of arbitrary planar structures
JOSA A, Vol. 15, Issue 5, pp. 1192-1201 (1998)
http://dx.doi.org/10.1364/JOSAA.15.001192
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Abstract
Modification of dipole emission that is due to its optical environment is calculated for planar layered structures. The layers are optically described by standard matrix techniques, and the dipole is included by using additive source terms for the electric field that depend on dipole orientation and wave polarization. These source terms also allow coupling through evanescent waves. We emphasize the applicability of this method to cases in which the power distribution into various modes is affected: dipole emission into guided modes and emission distribution into the various modes of structures that contain multilayer reflectors, such as microcavities.
© 1998 Optical Society of America
[Optical Society of America ]
OCIS Codes
(130.2790) Integrated optics : Guided waves
(130.5990) Integrated optics : Semiconductors
(230.3670) Optical devices : Light-emitting diodes
(230.7400) Optical devices : Waveguides, slab
(260.2110) Physical optics : Electromagnetic optics
Citation
H. Benisty, R. Stanley, and M. Mayer, "Method of source terms for dipole emission modification in modes of arbitrary planar structures," J. Opt. Soc. Am. A 15, 1192-1201 (1998)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-15-5-1192
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