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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 16, Iss. 1 — Jan. 1, 1999
  • pp: 141–148

Observation and analysis of near-field optical diffraction

Th. Huser, L. Novotny, Th. Lacoste, R. Eckert, and H. Heinzelmann  »View Author Affiliations


JOSA A, Vol. 16, Issue 1, pp. 141-148 (1999)
http://dx.doi.org/10.1364/JOSAA.16.000141


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Abstract

We present an experimental study of near-field optical interactions between an optical probe and sample objects with different dielectric properties. The interaction strongly affects the radiation emitted at angles beyond the critical angle of total internal reflection in the substrate (the forbidden light regime). Such an effect has been predicted theoretically. Our experimental data show that if a conducting object is close to the optical probe, p-polarized optical fields are deflected away from the object. On the other hand, s-polarized fields are deflected toward dielectric objects. The experimental results show good qualitative agreement with numerical simulations. The described effects have a strong influence on image formation in scanning near-field optical microscopy and thus have to be taken into account for image analysis.

© 1999 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(180.5810) Microscopy : Scanning microscopy
(240.7040) Optics at surfaces : Tunneling
(260.5430) Physical optics : Polarization

History
Original Manuscript: March 4, 1998
Revised Manuscript: July 31, 1998
Manuscript Accepted: September 18, 1998
Published: January 1, 1999

Citation
Th. Huser, L. Novotny, Th. Lacoste, R. Eckert, and H. Heinzelmann, "Observation and analysis of near-field optical diffraction," J. Opt. Soc. Am. A 16, 141-148 (1999)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-16-1-141


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References

  1. For a review of research in the field, see Proceedings of the IVth International Conference on Near-Field Optics and Related Techniques, P. Kruit, S. M. Lindsay, eds., Ultramicroscopy71, 1–398 (1998).
  2. A. Dereux, D. W. Pohl, “The 90° prism edge as a model SNOM probe: near-field, photon tunneling, and far-field properties,” in Near Field Optics, D. W. Pohl, D. Courjon, eds. (Kluwer Academic, Dordrecht, The Netherlands, 1993), Vol. 242, pp. 189–198.
  3. H. Heinzelmann, B. Hecht, D. W. Pohl, L. Novotny, “Forbidden light scanning near-field optical microscopy,” J. Microsc. 177, 115–118 (1994). [CrossRef]
  4. B. Hecht, H. Heinzelmann, D. W. Pohl, “Combined aperture SNOM/PSTM: best of both worlds?” in Proceedings of the 2nd International Conference on Near-Field Optics, P. Kruit, ed., Ultramicroscopy57, 228–234 (1995). [CrossRef]
  5. J. Koglin, U. C. Fischer, K. D. Brzoska, W. Göhde, H. Fuchs, “The tetrahedral tip as a probe for scanning near-field optical and for scanning tunneling microscopy,” in Photons and Local Probes, O. Marti, R. Möller, eds. (Kluwer Academic, Dordrecht, The Netherlands, 1995), Vol. 300, pp. 79–92.
  6. B. Hecht, H. Heinzelmann, D. W. Pohl, L. Novotny, “ ‘Tunnel’ near-field optical microscopy: TNOM-2,” in Photons and Local Probes, O. Marti, R. Möller, eds. (Kluwer Academic, Dordrecht, The Netherlands, 1995), Vol. 300, pp. 93–107.
  7. B. Hecht, H. Bielefeldt, L. Novotny, Y. Inouye, D. W. Pohl, “Local excitation, scattering, and interference of surface plasmons,” Phys. Rev. Lett. 77, 1889–1892 (1996). [CrossRef] [PubMed]
  8. Ch. Hafner, The Generalized Multiple Multipole Technique for Computational Electromagnetics (Artech House, Boston, 1990).
  9. L. Novotny, D. W. Pohl, P. Regli, “Light propagation through nanometer-sized structures: the two-dimensional-aperture scanning near-field optical microscope,” J. Opt. Soc. Am. A 11, 1768–1779 (1994). [CrossRef]
  10. K. Karrai, R. D. Grober, “Piezoelectric tip–sample distance control for near field optical microscopes,” Appl. Phys. Lett. 66, 1842–1844 (1995). [CrossRef]
  11. L. Novotny, D. W. Pohl, “Light propagation in scanning near-field optical microscopy,” in Photons and Local Probes, O. Marti, R. Möller, eds. (Kluwer Academic, Dordrecht, The Netherlands, 1995), Vol. 300, pp. 21–33.
  12. D. Van Labeke, D. Barchiesi, F. Baida, “Optical characterization of nanosources used in scanning near-field optical microscopy,” J. Opt. Soc. Am. A 12, 695–703 (1995). [CrossRef]
  13. D. Van Labeke, F. Baida, D. Barchiesi, D. Courjon, “A theoretical model for the inverse scanning tunneling optical microscope (ISTOM),” Opt. Commun. 114, 470–480 (1995). [CrossRef]
  14. D. Barchiesi, D. Van Labeke, “The inverse scanning tunneling near-field microscope (ISTOM) or tunnel scanning near-field optical microscope (TSNOM): 3D simulations and application to nano-sources,” in Proceedings of the IIIrd International Conference on Near-Field Optics and Related Techniques, P. Kruit, S. M. Lindsay, eds., Ultramicroscopy61, 17–20 (1995). [CrossRef]
  15. D. A. Higgins, D. A. Vanden Bout, J. Kerimon, P. F. Barbara, “Polarization-modulation near-field optical microscopy of mesostructured materials,” J. Phys. Chem. 100, 13794–13803 (1996). [CrossRef]
  16. Th. Lacoste, Th. Huser, R. Prioli, H. Heinzelmann, “Contrast enhancement using polarization-modulation scanning near-field optical microscopy (PM-SNOM),” in Proceedings of the IVth International Conference on Near-Field Optics and Related Techniques, P. Kruit, S. M. Lindsay, eds., Ultramicroscopy71, 333–340 (1998). [CrossRef]
  17. Th. Huser, “Polarization contrast in allowed and forbidden light scanning near-field optical microscopy,” Ph.D. dissertation (University of Basel, Basel, Switzerland, 1998).

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