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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Vol. 16, Iss. 10 — Oct. 1, 1999
  • pp: 2377–2391

Parametric blind deconvolution: a robust method for the simultaneous estimation of image and blur

Joanne Markham and José-Angel Conchello  »View Author Affiliations

JOSA A, Vol. 16, Issue 10, pp. 2377-2391 (1999)

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Blind-deconvolution microscopy, the simultaneous estimation of the specimen function and the point-spread function (PSF) of the microscope, is an underdetermined problem with nonunique solutions that are usually avoided by enforcing constraints on the specimen function and the PSF. We derived a maximum-likelihood-based method for blind deconvolution in which we assume a mathematical model for the PSF that depends on a small number of parameters (e.g., less than 20). The algorithm then estimates the unknown parameters together with the specimen function. The mathematical model ensures that all the constraints of the PSF are satisfied, and the maximum-likelihood approach ensures that the specimen is nonnegative. The method successfully estimates the PSF and removes out-of-focus blur. The PSF estimation is robust to aberrations in the PSF and to noise in the image.

© 1999 Optical Society of America

OCIS Codes
(100.1830) Image processing : Deconvolution
(100.3020) Image processing : Image reconstruction-restoration
(100.3190) Image processing : Inverse problems
(100.6890) Image processing : Three-dimensional image processing
(180.6900) Microscopy : Three-dimensional microscopy

Original Manuscript: October 9, 1998
Revised Manuscript: May 6, 1999
Manuscript Accepted: May 6, 1999
Published: October 1, 1999

Joanne Markham and José-Angel Conchello, "Parametric blind deconvolution: a robust method for the simultaneous estimation of image and blur," J. Opt. Soc. Am. A 16, 2377-2391 (1999)

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