Abstract
We characterize the refractive-index profiles of Z-cut and X-cut Zn-diffused substrates from the vapor phase. We obtained these profiles by reflectivity measurements of the samples, using the prism coupling technique at each step of a systematic polishing, and then fitting the data with a program that models a multilayer optical structure. For diffusions performed at 800 °C, four different layers were clearly distinguished in the diffused samples, the first one being a very thin layer of polycrystalline ZnO. Two step-index layers were also detected: One was isotropic, and the other showed birefringence depending on the crystal cut. These two layers were correlated with Zn-rich phases previously detected in Zn-diffused by x-ray techniques. The fourth layer detected presents a graded-index profile and corresponds to the formation of a Zn-containing solid solution with a -likestructure. These results are discussed and compared with the phases reported for Ti-diffused
© 1999 Optical Society of America
Full Article | PDF ArticleMore Like This
F. Schiller, B. Herreros, and G. Lifante
J. Opt. Soc. Am. A 14(2) 425-429 (1997)
Yu. N. Korkishko, V. A. Fedorov, E. A. Baranov, M. V. Proyaeva, T. V. Morozova, F. Caccavale, F. Segato, C. Sada, and S. M. Kostritskii
J. Opt. Soc. Am. A 18(5) 1186-1191 (2001)
Yu. N. Korkishko, V. A. Fedorov, T. M. Morozova, F. Caccavale, F. Gonella, and F. Segato
J. Opt. Soc. Am. A 15(7) 1838-1842 (1998)