We propose a new method for determining structures of semitransparent media from measurements of the extinguished power in scattering experiments. The method circumvents the problem of measuring the phase of the scattered field. We illustrate how this technique may be used to reconstruct both deterministic and random scatterers.
© 1999 Optical Society of America
[Optical Society of America ]
P. Scott Carney, E. Wolf, and G. S. Agarwal, "Diffraction tomography using power extinction measurements," J. Opt. Soc. Am. A 16, 2643-2648 (1999)