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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 16, Iss. 6 — Jun. 1, 1999
  • pp: 1326–1332

Polarization of light scattered by microrough surfaces and subsurface defects

Thomas A. Germer and Clara C. Asmail  »View Author Affiliations


JOSA A, Vol. 16, Issue 6, pp. 1326-1332 (1999)
http://dx.doi.org/10.1364/JOSAA.16.001326


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Abstract

The polarization of light scattered into directions out of the plane of incidence for 532-nm light incident at 45° with p polarization was measured from rough silicon, rough titanium nitride, polished fused silica and glass ceramic, and ground and incompletely polished black glass. Models for polarized light scattering from microroughness, subsurface defects, and facets are reviewed. The measurements demonstrate the validity of the models and the utility of polarized light scattering measurements for distinguishing between roughness and defects.

© 1999 Optical Society of America

OCIS Codes
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(240.5770) Optics at surfaces : Roughness
(260.2130) Physical optics : Ellipsometry and polarimetry
(290.5880) Scattering : Scattering, rough surfaces

History
Original Manuscript: November 12, 1998
Revised Manuscript: February 9, 1999
Manuscript Accepted: February 17, 1999
Published: June 1, 1999

Citation
Thomas A. Germer and Clara C. Asmail, "Polarization of light scattered by microrough surfaces and subsurface defects," J. Opt. Soc. Am. A 16, 1326-1332 (1999)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-16-6-1326

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