Longitudinal and transverse shifts of a light beam at total internal reflection was experimentally studied by far-field measurements on the reflected field. We propose to use a scanning tunneling optical microscope (STOM) to study these shifts in transmission, and we present a theoretical model of this proposed experiment to obtain a numerical estimation of these shifts. We study the reflection and the transmission of a three-dimensional polarized incident beam. We verify the validity of our formalism by studying the Goos–Hanchen shift in reflection and by comparing our results with published ones. Then we calculate STOM images of the transmitted field distribution. On the images the well-known Goos–Hanchen shift is easily observed. But we also encounter a smaller shift, perpendicular to the plane of incidence. This transverse shift was also observed in reflection by Imbert and Levy [Nouv. Rev. Opt. 6, 285 (1975)]. We study the variations of the two shifts versus various parameters such as the angle of incidence, the optical index, and the incident polarization. Then we discuss the feasibility of the near-field observation of these shifts.
© 2000 Optical Society of America
(180.5810) Microscopy : Scanning microscopy
(240.7040) Optics at surfaces : Tunneling
(260.2110) Physical optics : Electromagnetic optics
(260.6970) Physical optics : Total internal reflection
Fadi I. Baida, Daniel Van Labeke, and Jean-Marie Vigoureux, "Numerical study of the displacement of a three-dimensional Gaussian beam transmitted at total internal reflection. Near-field applications," J. Opt. Soc. Am. A 17, 858-866 (2000)