## Electromagnetic analysis of axially symmetric diffractive optical elements illuminated by oblique incident plane waves

JOSA A, Vol. 18, Issue 11, pp. 2901-2907 (2001)

http://dx.doi.org/10.1364/JOSAA.18.002901

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### Abstract

We present an analysis of axially symmetric diffractive optical elements illuminated by off-axis or oblique incident plane waves. The analysis is performed with a finite-difference time-domain method that has been formulated to exploit axial symmetry yet accommodate off-axis illumination. This approach is compared with a full three-dimensional formulation and is found to be more efficient in both memory requirements and computational time. Validation and applications of this method are presented.

© 2001 Optical Society of America

**OCIS Codes**

(000.4430) General : Numerical approximation and analysis

(050.1970) Diffraction and gratings : Diffractive optics

(350.3950) Other areas of optics : Micro-optics

**History**

Original Manuscript: January 11, 2001

Revised Manuscript: April 20, 2001

Manuscript Accepted: April 20, 2001

Published: November 1, 2001

**Citation**

Shouyuan Shi and Dennis W. Prather, "Electromagnetic analysis of axially symmetric diffractive optical elements illuminated by oblique incident plane waves," J. Opt. Soc. Am. A **18**, 2901-2907 (2001)

http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-18-11-2901

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