OSA's Digital Library

Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 19, Iss. 4 — Apr. 1, 2002
  • pp: 645–656

Using reflectance models for color scanner calibration

Miaohong Shi and Glenn Healey  »View Author Affiliations


JOSA A, Vol. 19, Issue 4, pp. 645-656 (2002)
http://dx.doi.org/10.1364/JOSAA.19.000645


View Full Text Article

Enhanced HTML    Acrobat PDF (281 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We examine the use of linear spectral reflectance models for calibrating a color scanner to generate device-independent CIE XYZ values from scanner vectors. Polynomial regression approaches to color scanner calibration use parameterized functions to approximate the calibration mapping over a set of training colors. These approaches can perform poorly if the parameterized functions do not accurately model the structure of the desired calibration mapping. Several studies have shown that linear reflectance models accurately characterize a wide range of materials. By viewing color scanner calibration as reflectance estimation, we can incorporate linear reflectance models into the calibration process. We show that in most cases linear models do not constrain the calibration problem sufficiently to allow exact recovery of X, Y, Z from a scanner vector obtained with three filters. By examining a series of methods that exploit information about reflectance functions, however, we show that reflectance information can be used to improve the accuracy of calibration over that of standard methods applied to the same set of inputs.

© 2002 Optical Society of America

OCIS Codes
(330.1710) Vision, color, and visual optics : Color, measurement
(330.1730) Vision, color, and visual optics : Colorimetry

History
Original Manuscript: July 24, 2001
Revised Manuscript: October 10, 2001
Manuscript Accepted: October 10, 2001
Published: April 1, 2002

Citation
Miaohong Shi and Glenn Healey, "Using reflectance models for color scanner calibration," J. Opt. Soc. Am. A 19, 645-656 (2002)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-19-4-645

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited