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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 19, Iss. 4 — Apr. 1, 2002
  • pp: 797–806

Differential interference contrast x-ray microscopy with twin zone plates

Burkhard Kaulich, Thomas Wilhein, Enzo Di Fabrizio, Filippo Romanato, Matteo Altissimo, Stefano Cabrini, Barbara Fayard, and Jean Susini  »View Author Affiliations


JOSA A, Vol. 19, Issue 4, pp. 797-806 (2002)
http://dx.doi.org/10.1364/JOSAA.19.000797


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Abstract

X-ray imaging in differential interference contrast (DIC) with submicrometer optical resolution was performed by using a twin zone plate (TZP) setup generating focal spots closely spaced within the TZP spatial resolution of 160 nm. Optical path differences introduced by the sample are recorded by a CCD camera in a standard full-field imaging and by an aperture photodiode in a standard scanning transmission x-ray microscope. Applying this x-ray DIC technique, we demonstrate for both the full-field imaging and scanning x-ray microscope methods a drastic increase in image contrast (approximately 20×) for a low-absorbing specimen, similar to the Nomarski DIC method for visible-light microscopy.

© 2002 Optical Society of America

OCIS Codes
(180.3170) Microscopy : Interference microscopy
(180.5810) Microscopy : Scanning microscopy
(180.7460) Microscopy : X-ray microscopy
(340.6720) X-ray optics : Synchrotron radiation
(340.7450) X-ray optics : X-ray interferometry

Citation
Burkhard Kaulich, Thomas Wilhein, Enzo Di Fabrizio, Filippo Romanato, Matteo Altissimo, Stefano Cabrini, Barbara Fayard, and Jean Susini, "Differential interference contrast x-ray microscopy with twin zone plates," J. Opt. Soc. Am. A 19, 797-806 (2002)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-19-4-797

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