High-resolution optical diffraction microscopy
JOSA A, Vol. 20, Issue 7, pp. 1223-1229 (2003)
http://dx.doi.org/10.1364/JOSAA.20.001223
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Abstract
In an optical diffraction microscopy experiment, one measures the phase and amplitude of the field diffracted by the sample and uses an inversion algorithm to reconstruct its map of permittivity. We show that with an iterative procedure accounting for multiple scattering, it is possible to visualize details smaller than λ/4 with relatively few illumination and observation angles. The roles of incident evanescent waves and noise are also investigated.
© 2003 Optical Society of America
[Optical Society of America ]
OCIS Codes
(110.6960) Imaging systems : Tomography
(180.6900) Microscopy : Three-dimensional microscopy
(290.3200) Scattering : Inverse scattering
Citation
Kamal Belkebir and Anne Sentenac, "High-resolution optical diffraction microscopy," J. Opt. Soc. Am. A 20, 1223-1229 (2003)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-20-7-1223
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