We report experimental results of the resonant scattering of light from a prism-glass/Ag/MgF2/air system with use of the attenuated total reflection technique for p and s polarized light. Two MgF2 film thicknesses were used. The system with the thinner dielectric layer supports two transverse magnetic (TM) and two transverse electric (TE) guided modes at a wavelength of 632.8 nm, and the system with the thicker dielectric layer supports three TM and three TE guided modes. In both cases we found dips in the specular reflection as a function of incident angle that is due to excitation of guided modes in the MgF2 film. The scattered light shows peaks at angles corresponding to the measured excitation of the guided modes. These peaks are due to single-order scattering and occur for any angle of the incident light. All features in the scattering response are enhanced in resonance conditions, and the efficiency of injecting light into the guide is reduced.
© 2003 Optical Society of America
(030.5770) Coherence and statistical optics : Roughness
(230.7390) Optical devices : Waveguides, planar
(290.5880) Scattering : Scattering, rough surfaces
(310.2790) Thin films : Guided waves
(310.6860) Thin films : Thin films, optical properties
Aldo S. Ramírez-Duverger, Jorge A. Gaspar-Armenta, and Raúl García-Llamas, "Resonant scattering of light from a glass/Ag/MgF2/air system with rough interfaces and supporting guided modes in attenuated total reflection," J. Opt. Soc. Am. A 20, 1582-1588 (2003)