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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Editor: Stephen A. Burns
  • Vol. 24, Iss. 10 — Oct. 1, 2007
  • pp: 3159–3167

Scattering of a Gaussian beam by an impedance half-plane

Yusuf Z. Umul  »View Author Affiliations


JOSA A, Vol. 24, Issue 10, pp. 3159-3167 (2007)
http://dx.doi.org/10.1364/JOSAA.24.003159


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Abstract

The diffraction of a Gaussian beam by an impedance half-plane is studied through the method of the modified theory of physical optics. An electric line source, which is defined in the complex space, is used to represent the Gaussian beam. The uniform evaluation of the diffraction integral is performed and the scattering patterns of the field are investigated for various numerical parameters of the incident wave.

© 2007 Optical Society of America

OCIS Codes
(260.0260) Physical optics : Physical optics
(260.1960) Physical optics : Diffraction theory

ToC Category:
Physical Optics

History
Original Manuscript: January 31, 2007
Revised Manuscript: June 18, 2007
Manuscript Accepted: June 25, 2007
Published: September 14, 2007

Citation
Yusuf Z. Umul, "Scattering of a Gaussian beam by an impedance half-plane," J. Opt. Soc. Am. A 24, 3159-3167 (2007)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-24-10-3159


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References

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  15. Y. Z. Umul, "Edge dislocation waves in the diffraction process by an impedance half-plane," J. Opt. Soc. Am. A 24, 507-511 (2007). [CrossRef]
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