Numerical reconstruction of optical surfaces
JOSA A, Vol. 25, Issue 7, pp. 1697-1709 (2008)
http://dx.doi.org/10.1364/JOSAA.25.001697
Enhanced HTML 
Acrobat PDF (1159 KB)
Abstract
There are several problems in optics that involve the reconstruction of surfaces such as wavefronts, reflectors, and lenses. The reconstruction problem often leads to a system of first-order differential equations for the unknown surface. We compare several numerical methods for integrating differential equations of this kind. One class of methods involves a direct integration. It is shown that such a technique often fails in practice. We thus consider one method that provides an approximate direct integration; we show that it is always converging and that it provides a stable, accurate solution even in the presence of measurement noise. In addition, we consider a number of methods that are based on converting the original equation into a minimization problem.
© 2008 Optical Society of America
OCIS Codes
(080.1010) Geometric optics : Aberrations (global)
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5700) Instrumentation, measurement, and metrology : Reflection
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: December 19, 2007
Revised Manuscript: April 3, 2008
Manuscript Accepted: April 10, 2008
Published: June 25, 2008
Citation
Jayoung Nam and Jacob Rubinstein, "Numerical reconstruction of optical surfaces," J. Opt. Soc. Am. A 25, 1697-1709 (2008)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-25-7-1697
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Interferometric Back Focal Plane Microellipsometry (AO)
- Multiple-Reflection Effects in Photoelastic Stress Analysis (AO)
- Interferometric measurement of phase change on reflection (AO)
- Optimization of the dynamic wavefront control of a pulsed kilojoule/nanosecond-petawatt laser facility (AO)
- Spectral interferometric technique to measure the ellipsometric phase of a thin-film structure (OL)
Related Conference Papers
« Previous Article | Next Article »
OSA is a member of 