Subspace-based optimization method for reconstructing extended scatterers: transverse electric case
JOSA A, Vol. 26, Issue 9, pp. 1932-1937 (2009)
http://dx.doi.org/10.1364/JOSAA.26.001932
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Abstract
The subspace-based optimization method is generalized to the transverse electric (TE) case for reconstructing the relative-permittivity profiles of extended scatterers. The essence of the subspace-based optimization method is that part of the contrast source is determined from the spectrum analysis without recourse to optimization, whereas the rest is determined by using an optimization procedure. We show that the dimension of the signal subspace behaves somewhat as a regularization parameter. Due to the vectorial property of the TE wave, the reconstructed profile in TE case is smoother than that in the transverse magnetic (TM) case.
© 2009 Optical Society of America
OCIS Codes
(180.6900) Microscopy : Three-dimensional microscopy
(290.3200) Scattering : Inverse scattering
ToC Category:
Scattering
History
Original Manuscript: May 20, 2009
Revised Manuscript: July 7, 2009
Manuscript Accepted: July 9, 2009
Published: August 11, 2009
Citation
Li Pan, Krishna Agarwal, Yu Zhong, Swee Ping Yeo, and Xudong Chen, "Subspace-based optimization method for reconstructing extended scatterers: transverse electric case," J. Opt. Soc. Am. A 26, 1932-1937 (2009)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-26-9-1932
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