Abstract

This paper presents a new approach to characterize nanoparticles using derivatives of scattering profiles of evanescent waves/surface plasmons. We start the procedure using the scattering profiles for an unknown configuration of nanoparticles, either from physical experiments or numerical simulations conducted for different nanoparticles on surfaces. We apply the statistical technique of compound estimation to recover the derivatives of scattering profiles. The L¹ discrepancies with the corresponding curves from known configurations are used to identify the most plausible configuration of particles that could yield the "experimental" profiles. We conduct a simulation study to see how often the new procedure correctly recovers the agglomeration level for gold spherical nanoparticles on a thin gold film. The results suggest that first derivatives are much more effective for characterization than undifferentiated profiles and that M₃₃ is the most useful element for distinguishing among configurations. The proposed compound estimation technique is more effective than typical inverse analyses based on look-up tables and can be used effectively in nanoparticle characterization platforms.

© 2007 Optical Society of America

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History
Original Manuscript: February 2, 2007
Manuscript Accepted: April 12, 2007
Revised Manuscript: April 11, 2007
Published: July 20, 2007

References

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Author Affiliations

Richard Charnigo, Mathieu Francoeur, M. Pinar Mengüç, Audrey Brock, Matthew Leichter, Cidambi Srinivasan

University of Kentucky

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